二维晶体的全息会聚电子束衍射（CBED）成像
Holographic convergent electron beam diffraction (CBED) imaging of two-dimensional crystals
摘要：
会聚束电子衍射（CBED）是近年来发展起来的一种研究二维材料的结构缺陷、堆积缺陷、吸附物、原子三维位移和层间距的有力工具。在二维晶体的单个CBED斑点中的干涉图案的形成可以被认为是全息图，因此CBED图案可以直接由从全息术改编的常规再现方法再现。在这项研究中，我们回顾了最近的结果应用CBED二维晶体及其异质结构：全息CBED的缺陷的重建和层间距离的测定双层，CBED的二维晶体单层显示吸附，和CBED的多层范德瓦尔斯系统与莫尔图案的局部结构测定。
英文摘要：
Convergent beam electron diffraction (CBED) performed on two-dimensional (2D) materials recently emerged as a powerful tool to study structural and stacking defects, adsorbates, atomic 3D displacements in the layers, and the interlayer distances. The formation of the interference patterns in individual CBED spots of 2D crystals can be considered as a hologram, thus the CBED patterns can be directly reconstructed by conventional reconstruction methods adapted from holography. In this study, we review recent results applying CBED to 2D crystals and their heterostructures: holographic CBED on bilayers with the reconstruction of defects and the determination of interlayer distance, CBED on 2D crystal monolayers to reveal adsorbates, and CBED on multilayered van der Waals systems with moiré patterns for local structural determination.
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