arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2003.12803cond-mat.mes-hallcond-mat.mtrl-sciphysics.comp-phphysics.data-anphysics.ins-det
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多层范德华结构的会聚束电子衍射

Convergent beam electron diffraction of multilayer van der Waals structures

Tatiana Latychevskaia, Colin Robert Woods, Yi Bo Wang, Matthew Holwill, Eric Prestat, Sarah J. Haigh, Kostya S. Novoselov

摘要:

会聚束电子衍射通常用于研究厚晶体中的变形和局部应变,通过将晶体结构与观察到的强度分布相匹配。最近,它已被证明,CBED可以应用于成像二维(2D)的晶体,其中直接重建是可能的,可以检索在纳米分辨率的三维晶体变形。在这里,我们证明了二阶效应允许获得关于晶体之间的堆叠安排的进一步信息。这种效应在由多层2D晶体组成的样品中尤其明显。我们表明,使用模拟和实验,扭曲的多层样品表现出额外的调制干涉条纹的CBED模式,即。例如,CBED莫尔条纹。一个简单的和强大的方法,从一个单一的拍摄CBED图案的组成和层数的评价证明。

英文摘要:

Convergent beam electron diffraction is routinely applied for studying deformation and local strain in thick crystals by matching the crystal structure to the observed intensity distributions. Recently, it has been demonstrated that CBED can be applied for imaging two-dimensional (2D) crystals where a direct reconstruction is possible and three-dimensional crystal deformations at a nanometre resolution can be retrieved. Here, we demonstrate that second-order effects allow for further information to be obtained regarding stacking arrangements between the crystals. Such effects are especially pronounced in samples consisting of multiple layers of 2D crystals. We show, using simulations and experiments, that twisted multilayer samples exhibit extra modulations of interference fringes in CBED patterns, i. e., a CBED moiré. A simple and robust method for the evaluation of the composition and the number of layers from a single-shot CBED pattern is demonstrated.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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