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arXiv 2107.01413cond-mat.mtrl-sciphysics.app-ph
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钒层厚度和沉积温度对Atmospheric Pressure热氧化法合成VO2的影响

Effect of Vanadium Thickness and Deposition Temperature on VO2 Synthesis using Atmospheric Pressure Thermal Oxidation

Ashok P, Yogesh Singh Chauhan, Amit Verma

摘要:

二氧化钒(VO 2)是一种相变材料,在~ 68 ℃时发生可逆的绝缘体-金属相变。常压热氧化法(APTO)是一种简单易行的制备钒(V)薄膜的方法。在最佳氧化时间下,得到了具有良好相变特性的VO 2薄膜。我们最近报道了一种改进的APTO工艺,使用阶梯温度曲线进行氧化(Thin Solid Films 706,138003(2020))。我们展示了一个超低的热预算的VO 2薄膜具有良好的电学和光学相变性能的合成。对于130 nm的室温射频溅射V薄膜,最佳氧化时间为~ 30 s。在这项工作中,我们研究了如何开始V膜厚度和沉积温度影响最佳氧化时间。采用射频磁控溅射法制备了不同厚度(15-212 nm)的V薄膜和不同沉积温度(~27-450 ℃)的120 nm厚的V薄膜。这些膜被氧化为不同的氧化持续时间,其特征在于使用拉曼和四探针测量,以找到每个沉积条件的最佳氧化持续时间。我们发现最佳氧化时间随V膜厚度和V沉积温度的增加而增加。我们模型的V膜厚度和沉积温度上的最佳氧化时间的影响,使用一个抛物线的法律,可用于获得中间V厚度/沉积温度的最佳氧化时间。

英文摘要:

Vanadium dioxide (VO2) is a phase transition material that undergoes a reversible insulator-metal phase transition at ~ 68 C. Atmospheric pressure thermal oxidation (APTO) of vanadium (V) is a simple VO2 synthesis method in which V thin film is oxidized in open air. For an optimum oxidation duration, VO2 films are obtained with good phase transition properties. We recently reported a modified APTO process using a step temperature profile for oxidation (Thin Solid Films 706, 138003 (2020)). We demonstrated an ultra-low thermal budget synthesis of VO2 thin films with good electrical and optical phase transition properties. For a 130 nm room-temperature RF sputtered V thin film, an optimum oxidation duration of ~ 30 s was obtained. In this work, we study how the starting V film thickness and deposition temperature affects the optimum oxidation duration. V thin films of varying thickness (15-212 nm) and 120 nm thick V films with varying deposition temperature (~27-450 C) are prepared using RF magnetron sputtering. These films are oxidized for different oxidation durations and characterized using Raman and four-probe measurements to find the optimum oxidation duration for each deposition condition. We find that the optimum oxidation duration increases with the increase in V film thickness and V deposition temperature. We model the effect of V film thickness and deposition temperature on the optimal oxidation time using a parabolic law which can be used to obtain the optimal oxidation times for intermediate V thicknesses/deposition temperatures.

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