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arXiv 2104.13552math.AP
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根据部分边界测量确定电导率和嵌入障碍物

Determining conductivity and embedded obstacles from partial boundary measurements

Jiaqing Yang

摘要:

在本文中,我们考虑了一个有界域上的逆电导率问题$Ω\subset\mathbb{R}^n$,$n\geq2$,也被称为电阻抗断层成像(EIT)的情况下,未知的不可穿透的障碍物被嵌入到$Ω$。我们表明,一个分段常数电导率函数和嵌入的障碍物可以同时恢复定义在域$Ω$的边界的任意小的开子集的局部狄利克雷到诺依曼映射。该方法依赖于在$H^1$ -空间中为电导率方程构造的耦合偏微分方程系统的适定性和对调和函数的一些基本先验估计。

英文摘要:

In this paper, we consider an inverse conductivity problem on a bounded domain $Ω\subset\mathbb{R}^n$, $n\geq2$, also known as Electrical Impedance Tomography (EIT), for the case where unknown impenetrable obstacles are embedded into $Ω$. We show that a piecewise-constant conductivity function and embedded obstacles can be simultaneously recovered in terms of the local Dirichlet-to-Neumann map defined on an arbitrary small open subset of the boundary of the domain $Ω$. The method depends on the well-posedness of a coupled PDE-system constructed for the conductivity equations in the $H^1$-space and some elementary a priori estimates for Harmonic functions.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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