arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2104.08092cond-mat.mtrl-sci
收藏

立方单晶(In,Ga)$_2$O$_3$合金薄膜的带隙展宽及拉曼活性声子模式行为

Bandgap widening and behavior of Raman-active phonon modes of cubic single-crystalline (In,Ga)$_2$O$_3$ alloy films

Johannes Feldl, Martin Feneberg, Alexandra Papadogianni, Jonas Lähnemann, Takahiro Nagata, Oliver Bierwagen, Rüdiger Goldhahn, Manfred Ramsteiner

AI总结:

本文研究分子束外延生长的立方(In,Ga)$_2$O$_3$合金薄膜,发现Ga掺入导致带隙蓝移,并利用拉曼声子模式频率作为测定Ga含量的灵敏指标。

摘要:

本文讨论了在分子束外延生长的(In$_{1-x}$,Ga$_x$)$_2$O$_3$合金薄膜中,将Ga掺入立方In$_2$O$_3$对电子和振动性质的影响。利用光谱椭偏仪,发现吸收起始边随Ga含量$x$呈线性依赖关系,在$x = 0.1$时蓝移高达150 meV。与之相一致的是,通过硬X射线光电子能谱确定的基本带隙也表现出蓝移。对于Sn掺杂的合金薄膜,从红外介电函数推导出吸收起始边和有效电子质量对电子浓度的依赖关系。基于拉曼光谱测量,分析了合金化对声子模式的影响。若干声子模式的频率被确定为光谱测定Ga含量的灵敏指标。

英文摘要:

The influence of Ga incorporation into cubic In$_2$O$_3$ on the electronic and vibrational properties is discussed for (In$_{1-x}$,Ga$_x$)$_2$O$_3$ alloy films grown by molecular beam epitaxy. Using spectroscopic ellipsometry, a linear dependence of the absorption onset on the Ga content $x$ is found with a blueshift of up to 150 meV for $x = 0.1$. Consistently, the fundamental band gap exhibits a blueshift as determined by hard X-ray photoelectron spectroscopy. The dependence of the absorption onset and the effective electron mass on the electron concentration is derived from the infrared dielectric functions for a Sn doped alloy film. The influence of alloying on phonon modes is analyzed on the basis of Raman spectroscopic measurements. The frequencies of several phonon modes are identified as sensitive measures for the spectroscopic determination of the Ga content.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑