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arXiv 2102.13148cond-mat.mtrl-sciphysics.app-ph
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高空间分辨率二次离子质谱法在铝锂合金中锂元素纳米化学定位中的应用

Application of high-spatial-resolution secondary ion mass spectrometry for nanoscale chemical mapping of lithium in an Al-Li alloy

Xu Xu, Chengge Jiao, Kexue Li, Min Hao, Katie. L. Moore, Timothy. L. Burnett, Xiaorong Zhou

摘要:

高空间分辨率二次离子质谱提供了一种在纳米级横向分辨率映射锂的方法。这种技术的实际实施提供了显着的潜力,揭示了锂在许多材料中的分布具有特殊的横向分辨率和元素的灵敏度。在这里,两个国家的最先进的方法被证明对铝锂合金可视化纳米级富锂相映射的7 Li+二次离子。使用射频O-等离子体离子源的NanoSIMS 50 L分析能够可视化宽度小至75 nm的针状T1(Al 2CuLi)相。一个紧凑的飞行时间二次离子质谱检测器添加到一个聚焦离子束扫描电子显微镜促进映射的T1阶段下降到45 nm的宽度使用Ga+离子束。与高分辨率电子显微镜的相关性证实了T1沉淀物的鉴定,它们的尺寸和分布在SIMS映射过程中观察到。

英文摘要:

High-spatial-resolution secondary ion mass spectrometry offers a method for mapping lithium at nanoscale lateral resolution. Practical implementation of this technique offers significant potential for revealing the distribution of Li in many materials with exceptional lateral resolution and elemental sensitivity. Here, two state-of-the-art methods are demonstrated on an aluminium-lithium alloy to visualise nanoscale Li-rich phases by mapping the 7Li+ secondary ion. NanoSIMS 50L analysis with a radio frequency O- plasma ion source enabled visualisation of needle-shaped T1 (Al2CuLi) phases as small as 75 nm in width. A compact time-of-flight secondary ion mass spectrometry detector added to a focused ion beam scanning electron microscope facilitated mapping of the T1 phases down to 45 nm in width using a Ga+ ion beam. Correlation with high resolution electron microscopy confirms the identification of T1 precipitates, their sizes and distribution observed during SIMS mapping.

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