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arXiv 2102.03048cond-mat.mtrl-sci
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外延CoFe2O4/Al2O3薄膜中的巨本征交换偏置

Colossal intrinsic exchange bias in epitaxial CoFe2O4/Al2O3 thin films

Detian Yang, Yu Yun, Arjun Subedi, Nicholas E. Rogers, David M. Cornelison, Peter A. Dowben, Xiaoshan Xu

摘要:

在这项工作中,我们证明了大量的本征交换偏置(3 kOe)在外延CoFe 2 O 4(111)薄膜沉积在Al 2 O 3(0001)衬底。该交换偏置指示固有交换或与反铁磁体组合的铁磁材料。结构、磁性和电子态分析证实了CoFe_2O_4(111)薄膜与Al_2O_3(0001)衬底之间存在界面层CoO。本征交换偏置的幂律厚度依赖性验证了其界面起源。这项工作表明,界面工程可以是一个有效的途径,实现大交换偏置。

英文摘要:

In this work, we demonstrate a massive intrinsic exchange bias (3 kOe) in epitaxial CoFe2O4(111) thin films deposited on Al2O3(0001) substrates. This exchange bias is indicative of intrinsic exchange or a ferromagnetic material combined with an antiferromagnet. The analysis of structure, magnetism and electronic states corroborate that there is an interfacial layer CoO between the CoFe2O4(111) thin film and the Al2O3(0001) substrate. The power-law thickness dependence of the intrinsic exchange bias verifies its interfacial origin. This work suggests interfacial engineering can be an effective route for achieving large exchange bias.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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