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arXiv 2102.00788physics.atom-ph
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通过RF功率变化测量离子位移以补偿过度微动

Measurement of ion displacement via RF power variation for excess micromotion compensation

Ryoichi Saito, Kota Saito, Takashi Mukaiyama

摘要:

我们演示了一种方法的微动最小化的被困离子在线性保罗阱的基础上的离子捕获位置位移由于杂散电场在径向平面的离子荧光成像的精确测量。径向平面中的位移量与杂散电场的强度成比例。因此,我们评估的微动补偿条件,通过测量从离子平衡位置使用两个不同的径向陷阱频率与各种组合的补偿电压的离子位移。该技术的残余电场不确定性达到每米几伏。这种补偿技术不依赖于入射冷却激光的取向或失谐和成像方向。因此,该方法适用于平面离子阱、限制激光传播角度的针式离子阱或用于传感和微扰应用的小型化离子阱系统。

英文摘要:

We demonstrate a method of micromotion minimization of a trapped ion in a linear Paul trap based on the precision measurement of the ion trapping position displacement due to a stray electric field in the radial plane by ion fluorescence imaging. The amount of displacement in the radial plane is proportional to the strength of a stray electric field. Therefore, we evaluated the micromotion compensation condition by measuring the ion displacements from the ion equilibrium position using two different radial trap frequencies with various combinations of the compensation voltage. The residual electric field uncertainty of this technique reached a few volts per meter. This compensation technique does not depend on the orientation of the incident cooling laser or the detuning and imaging direction. Therefore, this method is suitable for a planar ion trap, a stylus ion trap, which limits the propagation angle of lasers, or miniaturized ion trap systems for sensing and metrological applications.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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