微运动最小化的离子轨迹分析和微小力的测量
Ion trajectory analysis for micromotion minimization and the measurement of small forces
摘要：
对于用保罗阱中的离子进行实验，最小化微运动通常是必不可少的。为了诊断和补偿微动，我们已经实现了一种方法，该方法允许可靠地和有效地找到射频（RF）零点的位置，原则上，没有任何直流（DC）电压的变化。我们应用陷阱调制技术和焦点扫描成像提取3D离子的位置为各种RF驱动功率和分析的功率依赖性的平衡位置的被困离子。与常用的方法相比，搜索算法直接利用物理效应，而不是在高维参数空间中进行有效的数值最小化。使用这种方法，我们实现了补偿的剩余电场，导致过量的微动在径向平面的线性保罗陷阱下降到0.09 V/m。此外，这里采用的单个谐波捕获离子的精确位置确定也可以用于小力的检测。这一点可以通过测定135 yN精度的轻压力来证明。由于该方法仅基于成像，因此它可以同时应用于几个离子，并且与激光方向无关，因此非常适合与例如表面电极陷阱一起使用。
英文摘要：
For experiments with ions confined in a Paul trap, minimization of micromotion is often essential. In order to diagnose and compensate micromotion we have implemented a method that allows for finding the position of the radio-frequency (RF) null reliably and efficiently, in principle, without any variation of direct current (DC) voltages. We apply a trap modulation technique and focus-scanning imaging to extract 3d ion positions for various RF drive powers and analyze the power dependence of the equilibrium position of the trapped ion. In contrast to commonly used methods, the search algorithm directly makes use of a physical effect as opposed to efficient numerical minimization in a high-dimensional parameter space. Using this method we achieve a compensation of the residual electric field that causes excess micromotion in the radial plane of a linear Paul trap down to 0.09V/m. Additionally, the precise position determination of a single harmonically trapped ion employed here can also be utilized for the detection of small forces. This is demonstrated by determining light pressure forces with a precision of 135yN. As the method is based on imaging only, it can be applied to several ions simultaneously and is independent of laser direction and thus well-suited to be used with, for example, surface-electrode traps.
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