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arXiv 2008.11413physics.app-phcond-mat.mtrl-sci
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硅异质结太阳电池中带尾态的成像

Imaging of bandtail states in silicon heterojunction solar cells

M. Y. Teferi, H. Malissa, A. B. Morales-Vilches, C. T. Trinh, L. Korte, B. Stannowski, C. C. Williams, C. Boehme, K. Lips

摘要:

硅异质结(SHJ)太阳能电池代表了一种很有前途的技术途径,以提高光伏效率和降低制造成本。虽然SHJ太阳能电池的器件物理特性在过去已经被广泛研究,但纳米级电子过程(如电荷载流子产生、复合、捕获和渗透)在宏观上影响SHJ器件特性的方式尚未完全理解。我们报告的原子尺度电流渗流在国家的最先进的a-Si:H/c-Si异质结太阳能电池在环境操作条件下的研究,揭示了深刻的复杂性电子SHJ界面过程。利用导电原子力显微镜(cAFM),研究表明,SHJ太阳能电池的宏观电流-电压特性是由与掺杂a-Si:H选择性接触带尾态相关的局部纳米尺寸的渗透路径的平均值决定的,该渗透路径导致高于带隙的开路电压($V_{\mbox{OC}}$)高达1.2 V($V_{\mbox{OC}}>e E_{\mbox{gap}}^{\mbox{Si}}$).这并不违反光伏器件的物理学,而是纳米级电荷渗透路径的性质的结果,该纳米级电荷渗透路径源自陷阱辅助隧穿,导致暗漏电流。我们发现,广泛的分布的本地光电压是一个直接的后果,随机捕获的电荷在a-Si:H悬挂键缺陷,导致强烈的本地电位波动,并诱导随机电报噪声的暗电流。

英文摘要:

Silicon heterojunction (SHJ) solar cells represent a promising technological approach towards higher photovoltaics efficiencies and lower fabrication cost. While the device physics of SHJ solar cells have been studied extensively in the past, the ways in which nanoscopic electronic processes such as charge-carrier generation, recombination, trapping, and percolation affect SHJ device properties macroscopically have yet to be fully understood. We report the study of atomic scale current percolation at state-of-the-art a-Si:H/c-Si heterojunction solar cells under ambient operating conditions, revealing the profound complexity of electronic SHJ interface processes. Using conduction atomic force microscopy (cAFM), it is shown that the macroscopic current-voltage characteristics of SHJ solar cells is governed by the average of local nanometer-sized percolation pathways associated with bandtail states of the doped a-Si:H selective contact leading to above bandgap open circuit voltages ($V_{\mbox{OC}}$) as high as 1.2 V ($V_{\mbox{OC}}>e E_{\mbox{gap}}^{\mbox{Si}}$). This is not in violation of photovoltaic device physics but a consequence of the nature of nanometer-scale charge percolation pathways which originate from trap-assisted tunneling causing dark leakage current. We show that the broad distribution of local photovoltage is a direct consequence of randomly trapped charges at a-Si:H dangling bond defects which lead to strong local potential fluctuations and induce random telegraph noise of the dark current.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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