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arXiv 2008.08414eess.IVcs.CV
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改进的显微镜盲点去噪方法

Improving Blind Spot Denoising for Microscopy

Max-Planck Institute of Molecular Cell Biology and Genetics(马克斯·普朗克分子细胞生物学与遗传学研究所);Center for Systems Biology Dresden (CSBD)(德累斯顿系统生物学中心);Fondazione Human Technopole(人类技术城基金会);Max Planck Institute for the Physics of Complex Systems(马克斯·普朗克复杂系统物理研究所)

Anna S. Goncharova, Alf Honigmann, Florian Jug, Alexander Krull

摘要:

许多显微镜应用受到可用光总量的限制,因此受到所获得图像中的噪声水平的挑战。这个问题通常通过基于(监督)深度学习的去噪来解决。最近,通过对噪声统计进行假设,出现了自监督方法。这种方法直接在要去噪的图像上训练,不需要额外的成对训练数据。虽然取得了显着的效果,自我监督的方法可以产生高频工件,并实现较差的结果相比,监督的方法。在这里,我们提出了一种新的方法来提高自监督去噪的质量。考虑到光学显微镜图像通常是衍射有限的,我们建议将此知识包括在去噪过程中。我们假设干净的图像是与点扩散函数(PSF)卷积的结果,并在我们的神经网络的末尾显式地包含此操作。因此,我们能够消除高频伪影,并实现与传统监督方法非常接近的自监督结果。

英文摘要:

Many microscopy applications are limited by the total amount of usable light and are consequently challenged by the resulting levels of noise in the acquired images. This problem is often addressed via (supervised) deep learning based denoising. Recently, by making assumptions about the noise statistics, self-supervised methods have emerged. Such methods are trained directly on the images that are to be denoised and do not require additional paired training data. While achieving remarkable results, self-supervised methods can produce high-frequency artifacts and achieve inferior results compared to supervised approaches. Here we present a novel way to improve the quality of self-supervised denoising. Considering that light microscopy images are usually diffraction-limited, we propose to include this knowledge in the denoising process. We assume the clean image to be the result of a convolution with a point spread function (PSF) and explicitly include this operation at the end of our neural network. As a consequence, we are able to eliminate high-frequency artifacts and achieve self-supervised results that are very close to the ones achieved with traditional supervised methods.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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