arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2008.00412cond-mat.mes-hallcond-mat.mtrl-sci
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具有W插入层的垂直STT MRAM电池中畴壁介导的磁化反转的热稳定性

Thermal stability for domain wall mediated magnetization reversal in perpendicular STT MRAM cells with W insertion layers

G. Mihajlovic, N. Smith, T. Santos, J. Li, B. D. Terris, J. A. Katine

摘要:

提出了一种计算磁阻随机存储器(MRAM)单元磁场驱动畴壁介导磁化反转的能垒的解析模型,并应用该模型研究了不同厚度W层插入自由层(FL)时热稳定因子$Δ$随单元尺寸和温度的变化.我们发现,随着W厚度的增加,FL薄膜的有效垂直磁各向异性(PMA)能量密度单调增加,但同时,单元的$Δ$主要减小。我们的分析表明,除了饱和磁化$M_s$和交换刚度常数$A_\mathrm{ex}$的FL膜,量化$Δ$的细胞的参数是其矫顽场$H_c$,而不是净PMA场$H_k$的FL膜组成的细胞。

英文摘要:

We present an analytical model for calculating energy barrier for the magnetic field-driven domain wall-mediated magnetization reversal of a magneto-resistive random access memory (MRAM) cell and apply it to study thermal stability factor $Δ$ for various thicknesses of W layers inserted into the free layer (FL) as a function of the cell size and temperature. We find that, by increasing W thickness, the effective perpendicular magnetic anisotropy (PMA) energy density of the FL film monotonically increases, but at the same time, $Δ$ of the cell mainly decreases. Our analysis shows that, in addition to saturation magnetization $M_s$ and exchange stiffness constant $A_\mathrm{ex}$ of the FL film, the parameter that quantifies the $Δ$ of the cell is its coercive field $H_c$, rather than the net PMA field $H_k$ of the FL film comprising the cell.

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