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arXiv 2007.14316cond-mat.mes-hall
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金属/半导体量子环中温度相关的抗磁-顺磁跃迁

Temperature dependent diamagnetic-paramagnetic transitions in metal/semiconductor quantum rings

Neal Blackman, Dentcho A. Genov

摘要:

本文对薄量子环中的温度相关的抗磁-顺磁跃迁进行了理论研究。我们的研究表明,金属/半导体环的磁化率可以表现出多个符号翻转在中高温下取决于环中的传导电子的数量($N$)和自旋效应是否包括在内。当温度从绝对零度升高时,磁化率开始在特征温度以上翻转符号,该特征温度根据$N^{-1}$或$N^{-1/2}$与电子数成反比,这取决于自旋效应的存在和$N\,\mathrm{mod}\,4$的值。分析结果推导出的磁化率在低和高的温度限制,明确示出的自旋效应的环居里常数。

英文摘要:

We present theoretical studies of temperature dependent diamagnetic-paramagnetic transitions in thin quantum rings. Our studies show that the magnetic susceptibility of metal/semiconductor rings can exhibit multiple sign flips at intermediate and high temperatures depending on the number of conduction electrons in the ring ($N$) and whether or not spin effects are included. When the temperature is increased from absolute zero, the susceptibility begins to flip sign above a characteristic temperature that scales inversely with the number of electrons according to $N^{-1}$ or $N^{-1/2}$, depending on the presence of spin effects and the value of $N\,\mathrm{mod}\,4$. Analytical results are derived for the susceptibility in the low and high temperature limits, explicitly showing the spin effects on the ring Curie constant.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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