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arXiv 2006.14299cond-mat.mes-hallcond-mat.supr-con
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用于Lévy噪声检测的跨约瑟夫森结的电压降

Voltage drop across Josephson junctions for Lévy noise detection

Claudio Guarcello, Giovanni Filatrella, Bernardo Spagnolo, Vincenzo Pierro, Davide Valenti

摘要:

我们建议通过测量电流偏置约瑟夫森结上的平均电压降来表征Lévy分布的随机涨落。我们表明,噪声引起的开关过程中的约瑟夫森搓衣板电位可以用来揭示和表征Lévy波动,也如果嵌入在一个热噪声背景。作为噪声强度的函数的平均电压降的测量允许推断表征Lévy分布波动的稳定性指数的值。在从亚稳态的Lévy驱动逃逸过程的情况下,对平均速度的分析估计与对跨结的平均电压降的数值计算完全一致。当热激活和量子隧穿开关过程都可以忽略时,在小偏置电流和低温下达到最佳性能,\emph{i.e.}。在这项工作中讨论的影响铺平了道路走向一个有效的和可靠的方法来表征Lévy组件最终存在于一个未知的噪声信号。

英文摘要:

We propose to characterize Lévy-distributed stochastic fluctuations through the measurement of the average voltage drop across a current-biased Josephson junction. We show that the noise induced switching process in the Josephson washboard potential can be exploited to reveal and characterize Lévy fluctuations, also if embedded in a thermal noisy background. The measurement of the average voltage drop as a function of the noise intensity allows to infer the value of the stability index that characterizes Lévy-distributed fluctuations. An analytical estimate of the average velocity in the case of a Lévy-driven escape process from a metastable state well agrees with the numerical calculation of the average voltage drop across the junction. The best performances are reached at small bias currents and low temperatures, \emph{i.e.}, when both thermally activated and quantum tunneling switching processes can be neglected. The effects discussed in this work pave the way toward an effective and reliable method to characterize Lévy components eventually present in an unknown noisy signal.

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