欠阻尼约瑟夫森结中电容增强的热逃逸
Capacitively Enhanced Thermal Escape in Underdamped Josephson Junctions
摘要：
我们在实验上研究了亚微安临界电流低于0.5K的欠阻尼电容并联和非并联约瑟夫森结中的逃逸动力学。在分流结中，热激活过程被保存到最高温度，在未分流结中的逃逸表现出相扩散。我们在分流结的观察是在良好的协议与标准的热激活逃逸，不像在unshunted结的结果。
英文摘要：
We have studied experimentally the escape dynamics in underdamped capacitively shunted and unshunted Josephson junctions with submicroampere critical currents below 0.5 K temperatures. In the shunted junctions, thermal activation process was preserved up to the highest temperature where the escape in the unshunted junctions exhibits the phase diffusion. Our observations in the shunted junctions are in good agreement with the standard thermal activation escape, unlike the results in the unshunted junctions.
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