$\mathrm{Fe_3O_4}$（001）薄膜的阳离子和晶格位置选择性磁深度分布
Cation- and lattice-site-selective magnetic depth profiles of ultrathin $\mathrm{Fe_3O_4}$(001) films
摘要：
详细了解薄膜的表面性质是至关重要的光谱，催化和自旋输运数据的正确解释。我们目前的X射线磁性圆二色性（XMCD）和X射线共振磁反射率（XRMR）测量的$\mathrm{Fe_3O_4}$薄膜上获得的三个共振能量对应于不同的阳离子物种$\mathrm{Fe^{2+}_{oct}}$，$\mathrm{Fe^{3+}_{tet}}$和$\mathrm{Fe^{3+}_{oct}}$位于八面体和四面体网站的反尖晶石结构的$\mathrm{Fe_3O_4}$的磁深度配置文件。通过使用多重态计算分析$\mathrm{Fe_3O_4}$的XMCD谱，可以分离每个阳离子物种的共振能量。对这三种共振能量进行XRMR产生对应于一种特定阳离子物种的磁深度分布。两种$\mathrm{Fe^{3+}}$阳离子的深度分布揭示了增强磁化的$\mathrm{3.9 \pm 1~Å}$厚表面层，这可能是由于这些离子过量而牺牲了表面区域中的$\mathrm{Fe^{2+}_{oct}}$物质。磁增强$\mathrm{Fe^{3+}_{tet}}$层还比$\mathrm{Fe^{3+}_{oct}}$层更远离表面地移动大约$\mathrm{3\pm 1.5~Å}$。
英文摘要：
A detailed understanding of ultrathin film surface properties is crucial for the proper interpretation of spectroscopic, catalytic and spin-transport data. We present x-ray magnetic circular dichroism (XMCD) and x-ray resonant magnetic reflectivity (XRMR) measurements on ultrathin $\mathrm{Fe_3O_4}$ films to obtain magnetic depth profiles for the three resonant energies corresponding to the different cation species $\mathrm{Fe^{2+}_{oct}}$, $\mathrm{Fe^{3+}_{tet}}$ and $\mathrm{Fe^{3+}_{oct}}$ located on octahedral and tetrahedral sites of the inverse spinel structure of $\mathrm{Fe_3O_4}$. By analyzing the XMCD spectrum of $\mathrm{Fe_3O_4}$ using multiplet calculations, the resonance energy of each cation species can be isolated. Performing XRMR on these three resonant energies yields magnetic depth profiles that correspond each to one specific cation species. The depth profiles of both kinds of $\mathrm{Fe^{3+}}$ cations reveal a $\mathrm{3.9 \pm 1~Å}$-thick surface layer of enhanced magnetization, which is likely due to an excess of these ions at the expense of the $\mathrm{Fe^{2+}_{oct}}$ species in the surface region. The magnetically enhanced $\mathrm{Fe^{3+}_{tet}}$ layer is additionally shifted about $\mathrm{3\pm 1.5~Å}$ farther from the surface than the $\mathrm{Fe^{3+}_{oct}}$ layer.
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