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arXiv 2004.12313physics.app-phcond-mat.mes-hall
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石墨烯-半导体接触

Graphene-Semiconductor Contact

M. Javadi

摘要:

介绍了石墨烯-半导体结的系统处理。石墨烯费米能级的有限态密度导致石墨烯-半导体界面的奇异电子性质。通常,由于石墨烯的内部势,肖特基-莫特极限和势垒高度的总和规则被违反。通过合并半导体-半导体和金属-半导体结的主要特性,石墨烯-半导体接触可以被认为是前所未有的\emph{semimetal-semiconductor junction}的原型。广义界面方程揭示了石墨烯中载流子密度与结特性的耦合。它将被证明是众所周知的效果,可调势垒高度直接关系到结电容。此外,图像力效应的存在下的势垒可调谐性的相对影响进行了研究。详细讨论了获得结的内建电势、势垒高度和电容的实验方法。通过对实验数据的分析,揭示了石墨烯-硅样品界面处强反型层的形成。

英文摘要:

A systematic treatment of graphene-semiconductor junction is presented. Finite density of states at the Fermi level of graphene leads to exotic electronic properties at graphene-semiconductor interface. Quite generally, the Schottky-Mott limit and the sum rule of barrier heights are violated due to the internal potential of graphene. By merging the principal characteristics of semiconductor-semiconductor and metal-semiconductor junctions, the graphene-semiconductor contact may be considered as an archetype of unprecedented \emph{semimetal-semiconductor junction}. Generalized interface equations disclose the coupling of junction characteristics with the density of charge carriers in graphene. It will be shown that the well-known effect of tunable barrier height is directly related to the junction capacitance. Furthermore, the relative impact of image-force effect in the presence of barrier tunability is investigated. Experimental methods to gain built-in potential, barrier height, and capacitance of the junction are discussed in detail. Also the development of strong inversion layer at the interface of graphene-silicon samples is uncovered by analyzing experimental data.

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