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arXiv 2004.02721cond-mat.mtrl-sci
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纳米结构的X射线散射研究

Investigation of Nanostructures with X-ray Scattering Techniques

Dominik Kriegner, Milan Dopita

摘要:

纳米材料的结构研究因其种类繁多和广泛的应用而引起了人们的极大关注。特别是,不断改进的机器,无论是在实验室和大规模的设施,与方法的改进,可用于研究纳米结构,从外延纳米材料,纳米晶体薄膜和涂层,纳米粒子和胶体纳米晶体,使我们能够获得更详细的了解他们的结构特性。由于结构基本上决定了材料的物理性质,这提高了结构研究的可能性,也使人们能够更深入地了解结构与性质的关系。在这期题为“用X射线散射技术研究纳米结构”的特刊中,五篇文章展示了各个研究领域的最新进展。贡献涵盖的主题,如不同的中子散射磁性多层膜,有机薄膜的外延取向,纳米粒子排序和化学成分分析,以及纳米聚焦X射线束与电气测量相结合。

英文摘要:

The structural investigations of nanomaterials motivated by their large variety and diverse set of applications have attracted considerable attention. In particular, the ever-improving machinery, both in laboratory and at large scale facilities, together with the methodical improvements available for studying nanostructures ranging from epitaxial nanomaterials, nanocrystalline thin films and coatings, to nanoparticles and colloidal nanocrystals allows us to gain a more detailed understanding of their structural properties. As the structure essentially determines the physical properties of the materials, this advances the possibilities of structural studies and also enables a deeper understanding of the structure to property relationships. In this special issue entitled "Investigation of Nanostructures with X-ray Scattering Techniques" five contributions show the recent progress in various research fields. Contributions cover topics as diverse as neutron scattering on magnetic multilayer films, epitaxial orientation of organic thin films, nanoparticle ordering and chemical composition analysis, and the combination of nanofocused X-ray beams with electrical measurements.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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