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arXiv 2003.10722cond-mat.softphysics.data-anphysics.optics

光镊的理论校正方法:获取体相中和表面上胶体粒子之间的平均力势

Theoretical correction methods for optical tweezers: Acquisition of potentials of mean forces between colloidal particles in a bulk and on a surface

Ken-ichi Amano, Rikako Suzuki, Madoka Takasu

AI总结:

本文基于统计力学提出线光镊平均力势的理论校正方法,无需经验拟合即可获得PMF及外势,并拓展至表面单光镊与体相双光束光镊场景。

摘要:

已知线光镊(LOT)可以测量体相中胶体粒子之间的平均力势(PMF)。然而,为了校正长距离处的势垒升高,使用LOT获得的PMF在呈现最终形式的结果之前会经过经验性修正。在本通讯中,我们利用统计力学推导了获取PMF的理论校正方法。使用这些新方法,可以在不使用经验拟合方程的情况下获得PMF。通过这些新方法,还可以获得由LOT诱导并作用于被捕获的两个胶体粒子上的外势。作为补充研究,我们阐述了两种获取PMF的方法:一种用于获取基底表面上胶体粒子之间的PMF,其中使用焦点固定的普通单光镊;另一种用于获取体相中被双光束光镊捕获的胶体粒子之间的PMF。这些方法同样可以获得作用于被捕获的两个胶体粒子上的外势。

英文摘要:

It is known that line optical tweezers (LOT) can measure potential of mean force (PMF) between colloidal particles in the bulk. However, PMF obtained with LOT is empirically modified before showing the result of the final form in order to correct the potential rise at long distances. In the present letter, we derive theoretical correction methods for acquisition of PMF by using statistical mechanics. Using the new methods, PMF can be obtained without the empirical fitting equation. Through the new methods, external potential acting on the trapped two colloidal particles induced by LOT can also be obtained. As an additional study, we explain two methods for obtaining PMF between colloidal particles on a substrate surface, in which a normal single optical tweezers with a fixed focal point is used, and for obtaining PMF between colloidal particles trapped by dual-beam optical tweezers in the bulk. These methods can also obtain the external potential acting on the trapped two colloidal particles.

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