用电子涡旋束探测磁性杂质
Detection of magnetic impurities using electron vortex beams
摘要：
电子显微镜突出电子波提供更高的空间分辨能力相比，他们的光学同行。本文以磁偶极矩为例，从理论上研究了在透射电子显微镜（TEM）中产生的扭曲电子与磁性杂质的相互作用。除了通常的光学相位外，磁偶极矩产生的非均匀矢量势对电子的内禀轨道角动量有额外的贡献，导致Gouy相移。利用参考高斯柱面波干涉出射的扭曲电子束，通过旋转和变形的干涉图样可以直接确定磁偶极子的大小和方向。所得到的结果表明，有用的扭曲电子束探测的原子和纳米磁性的杂质TEM和所提出的模型提供了概念基础，为今后的发展TEM方法。
英文摘要：
Electron microscopy stands out as electron waves providing higher spatial resolving power compared to their optical counterpart. Here we investigate theoretically the interaction of twisted electrons generated in transmission electron microscope (TEM) and magnetic impurity, in which the magnetic dipole moment is taken as a demonstration element. In addition to the usual optical phase, the inhomogeneous vector potential generated by the magnetic dipole moment makes additional contribution to the intrinsic orbital angular momentum of electrons, resulting in a Gouy phase shift. By interfering the outgoing twisted electron beam with a reference Gaussian-cylindrical wave, one can determine the magnitude and orientation of magnetic dipole directly via the rotational and deformed interference pattern. The obtained results demonstrate the usefulness of twisted electron beams for probing the atomic- and nanoscale magnetism of impurity by TEM and the proposed model provides the conceptual basis for future developments of the TEM method.
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