arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2003.03179cs.LGstat.ML
收藏

No Regret Sample Selection with Noisy Labels

RIKEN AIP(日本理化学研究所革新智能统合研究中心);Kyushu University(九州大学)

H. Song, N. Mitsuo, S. Uchida, D. Suehiro

英文摘要:

Deep neural networks (DNNs) suffer from noisy-labeled data because of the risk of overfitting. To avoid the risk, in this paper, we propose a novel DNN training method with sample selection based on adaptive k-set selection, which selects k (< n) clean sample candidates from the whole n noisy training samples at each epoch. It has a strong advantage of guaranteeing the performance of the selection theoretically. Roughly speaking, a regret, which is defined by the difference between the actual selection and the best selection, of the proposed method is theoretically bounded, even though the best selection is unknown until the end of all epochs. The experimental results on multiple noisy-labeled datasets demonstrate that our sample selection strategy works effectively in the DNN training; in fact, the proposed method achieved the best or the second-best performance among state-of-the-art methods, while requiring a significantly lower computational cost. The code is available at https://github.com/songheony/TAkS.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑