arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2002.08259cond-mat.mtrl-sciphysics.app-ph
收藏

生长条件对SrFe $_{12}$ O $_{19}$薄膜磁性的影响及Co / SrFe $_{12}$ O $_{19}$双层膜的行为

Influence of the growth conditions on the magnetism of SrFe$_{12}$O$_{19}$ thin films and the behavior of Co / SrFe$_{12}$O$_{19}$ bilayers

G. D. Soria, J. F. Marco, A. Mandziak, S. Sánchez-Cortés, M. Sánchez-Arenillas, J. E. Prieto, J. Dávalos, M. Foerster, L. Aballe, J. López-Sánchez, J. C. Guzmán… 展开作者

G. D. Soria, J. F. Marco, A. Mandziak, S. Sánchez-Cortés, M. Sánchez-Arenillas, J. E. Prieto, J. Dávalos, M. Foerster, L. Aballe, J. López-Sánchez, J. C. Guzmán-Mínguez, C. Granados-Miralles, J. de la Figuera, A. Quesada

摘要:

采用射频磁控溅射法在Si(100)衬底上制备了SrFe $_{12}$ O $_{19}$(SFO)薄膜,利用显微镜、衍射和光谱等技术对薄膜的成分、结构和磁性进行了表征。穆斯堡尔谱被用来确定薄膜的磁化方向,这被发现是由溅射功率和薄膜的厚度控制。此外,SFO薄膜和沉积的钴覆盖层之间的耦合进行了研究,通过同步加速器为基础的光谱显微镜技术。在SFO/Co界面的结构耦合建议占实验观察。为了再现系统的实验行为,进行了微磁模拟。

英文摘要:

SrFe$_{12}$O$_{19}$ (SFO) films grown on Si (100) substrates by radio-frequency magnetron sputtering have been characterized in terms of composition, structural and magnetic properties by a combination of microscopy, diffraction and spectroscopy techniques. Mössbauer spectroscopy was used to determine the orientation of the films magnetization, which was found to be controlled by both the sputtering power and the thickness of the films. Additionally, the coupling between the SFO films and a deposited cobalt overlayer was studied by means of synchrotron-based spectromicroscopy techniques. A structural coupling at the SFO/Co interface is suggested to account for the expetimental observations. Micromagnetic simulations were performed in order to reproduce the experimental behaviour of the system.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑