arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 2001.07932math.STstat.TH

基于Stein特征的正态分布拟合优度检验新方法

A new goodness of fit test for normal distribution based on Stein's characterization

Sudheesh Kattumannil

AI总结:

本文提出一种基于经验零偏变换与经验分布距离的非参数正态性检验,研究其渐近性质,通过模拟和真实数据评估性能,并开发了刀切经验似然比检验。

摘要:

本文基于经验零偏变换与经验分布之间的距离,提出了一种简单的非参数正态性检验方法。研究了检验统计量的渐近性质。通过蒙特卡洛模拟研究评估了所提检验的有限样本性能。将我们的检验功效与其他几种正态性检验进行了比较。我们使用两个真实数据集说明了检验过程。我们还开发了一种针对标准正态分布的刀切经验似然比检验。

英文摘要:

In this paper, we develop a simple non-parametric test for testing normal distribution based on the distance between empirical zero-bias transformation and empirical distribution. The asymptotic properties of the test statistic are studied. The finite sample performance of the proposed test is evaluated through a Monte Carlo simulation study. The power of our test is compared with several other tests for normality. We illustrate the test procedure using two real data sets. We also develop a jackknife empirical likelihood ratio test for standard normal distribution.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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