用电压塑性规则解释长时程增强现象的实验结果
Paradoxical Results of Long-Term Potentiation explained by Voltage-based Plasticity Rule
摘要：
实验表明，在近端突触中引起长时程增强的相同刺激模式，将在远端突触中引起长时程抑制。为了理解这些和其他令人惊讶的观察结果，我们在突触的位置使用了赫布可塑性的现象学模型。我们的计算模型描述了Hebbian条件的前和突触后神经元的联合活动，在一个紧凑的形式作为相互作用的谷氨酸痕迹留下的突触前尖峰的突触后电压的时间过程。我们使用实验记录的海马和新皮层中的树突电压迹线来测试该模型。我们发现，在一个受刺激的突触附近的电压的时间过程是一个可靠的预测是否受刺激的突触经历增强，抑郁症，或没有变化。我们的模型可以解释突触增强和抑制实验的不同结果的存在-乍一看似乎是矛盾的-取决于突触的树突位置和刺激的频率或时间。
英文摘要：
Experiments have shown that the same stimulation pattern that causes Long-Term Potentiation in proximal synapses, will induce Long-Term Depression in distal ones. In order to understand these, and other, surprising observations we use a phenomenological model of Hebbian plasticity at the location of the synapse. Our computational model describes the Hebbian condition of joint activity of pre- and post-synaptic neuron in a compact form as the interaction of the glutamate trace left by a presynaptic spike with the time course of the postsynaptic voltage. We test the model using experimentally recorded dendritic voltage traces in hippocampus and neocortex. We find that the time course of the voltage in the neighborhood of a stimulated synapse is a reliable predictor of whether a stimulated synapse undergoes potentiation, depression, or no change. Our model can explain the existence of different -- at first glance seemingly paradoxical -- outcomes of synaptic potentiation and depression experiments depending on the dendritic location of the synapse and the frequency or timing of the stimulation.
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