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arXiv 1910.03334cs.CVeess.IV
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表面缺陷自动分割的神经风格转换缺陷样本模拟

Defective samples simulation through Neural Style Transfer for automatic surface defect segment

School of Optical and Electronic Information, Huazhong University of Science and Technology(华中科技大学光学与电子信息学院)

Taoran Wei, Danhua Cao, Xingru Jiang, Caiyun Zheng, Lizhe Liu

摘要:

在工业产品质量检测中,由于缺陷样本的缺乏,训练好的分割模型在在线应用时容易出现过拟合现象。针对这一问题,提出了一种基于神经风格转换的缺陷样本模拟算法.该仿真算法只需要少量的缺陷样本进行训练,就可以高效地生成仿真样本,为下一步的分割任务提供支持。在我们的工作中,我们引入了一个掩蔽的直方图匹配模块,以保持颜色的一致性生成的区域和真正的缺陷。为了保持纹理与周围像素的一致性,我们采用快速风格转换算法将生成的区域融合到背景中。同时,我们还使用直方图损失来进一步提高生成图像的质量。此外,我们提出了一种新的分段网络结构,使其更适合于缺陷分割任务。我们分别用实际缺陷样本和生成的模拟样本在按钮数据集上训练分段网络。结果表明,仅使用生成的模拟样本训练的模型F1得分达到0.80,优于真实样本结果。

英文摘要:

Owing to the lack of defect samples in industrial product quality inspection, trained segmentation model tends to overfit when applied online. To address this problem, we propose a defect sample simulation algorithm based on neural style transfer. The simulation algorithm requires only a small number of defect samples for training, and can efficiently generate simulation samples for next-step segmentation task. In our work, we introduce a masked histogram matching module to maintain color consistency of the generated area and the true defect. To preserve the texture consistency with the surrounding pixels, we take the fast style transfer algorithm to blend the generated area into the background. At the same time, we also use the histogram loss to further improve the quality of the generated image. Besides, we propose a novel structure of segment net to make it more suitable for defect segmentation task. We train the segment net with the real defect samples and the generated simulation samples separately on the button datasets. The results show that the F1 score of the model trained with only the generated simulation samples reaches 0.80, which is better than the real sample result.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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