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arXiv 1909.11976cond-mat.mes-hallquant-ph
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耦合到硅中电子层的超导电荷传感器

Superconducting charge sensor coupled to an electron layer in silicon

Máté Jenei, Ruichen Zhao, Kuan Y. Tan, Tuomo Tanttu, Kok W. Chan, Yuxin Sun, Vasilii Sevriuk, Fay Hudson, Alessandro Rossi, Andrew Dzurak, Mikko Möttönen

摘要:

旨在转移半导体器件中的单个电子并检测可能的转移错误的方案对于MEMS应用越来越重要。研究了超导约瑟夫森结电荷探测器与硅中场效应电子岛的耦合。我们的设备的灵活性允许一个调谐耦合使用检测器作为一个额外的栅极电极。我们研究的电子传感器在不同的设备配置的可靠性和各种操作模式的电子泵实验中的错误检测的适用性。结果,我们获得了5.87 kHz的电荷检测带宽与单位信噪比在300 mK浴温度。

英文摘要:

Schemes aimed at transferring individual electrons in semiconductor devices and detecting possible transfer errors have increasing importance for metrological applications. We study the coupling of a superconducting Josephson-junction-based charge detector to an electron island defined by field-effect in silicon. The flexibility of our device allows one to tune the coupling using the detector as an additional gate electrode. We study the reliability of the electron sensor in different device configurations and the suitability of various operation modes for error detection in electron pumping experiments. As a result, we obtain a charge detection bandwidth of 5.87 kHz with unity signal to noise ratio at 300 mK bath temperature.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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