TEM中的同步加速器：空间分辨高能精细结构谱
A Synchrotron in the TEM: Spatially Resolved Fine Structure Spectra at High Energies
摘要：
核心电子激发光谱的精细结构分析是物理科学的基石表征技术。光谱最常用的测量方法是同步辐射和X射线光斑尺寸在微米到毫米的尺度上。或者，（扫描）透射电子显微镜（（S）TEM）中的电子能量损失谱（EELS）提供了超过1000倍的空间分辨率增加，这是研究纳米结构材料的一个变革性优势。然而，EELS适用性通常限于低于约2keV的激发，即，主要是元素周期表前三行的元素。在这里，使用国家的最先进的EELS仪器，我们目前纳米分辨精细结构EELS测量出前所未有的12千电子伏的信噪比媲美的同步加速器。我们展示了这种技术的优势，在示例性的实验。
英文摘要：
Fine structure analysis of core electron excitation spectra is a cornerstone characterization technique across the physical sciences. Spectra are most commonly measured with synchrotron radiation and X-ray spot sizes on the μm to mm scale. Alternatively, electron energy loss spectroscopy (EELS) in the (scanning) transmission electron microscope ((S)TEM) offers over a 1000 fold increase in spatial resolution, a transformative advantage for studies of nanostructured materials. However, EELS applicability is generally limited to excitations below ~2 keV, i.e., mostly to elements in just the first three rows of the periodic table. Here, using state-of-the-art EELS instrumentation, we present nm resolved fine structure EELS measurements out to an unprecedented 12 keV with signal-to-noise ratio rivaling that of a synchrotron. We showcase the advantages of this technique in exemplary experiments.
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