arXivDaily arXiv每日学术速递 周一至周五更新
arXiv周末暂无论文更新,休息一下吧,周末愉快~~
arXiv 1904.04367cond-mat.mtrl-sciphysics.app-ph
收藏

对应:对“关于三维拓扑绝缘体电流诱导自旋极化的认识“的回复

Correspondence: Reply to "On the understanding of current-induced spin polarization of 3D topological insulators"

C. H. Li, O. M. J. van t Erve, S. Rajput, L. Li, B. T. Jonker

摘要:

我们报道了第一个自旋电位测量,以电检测自旋极化所产生的自旋动量锁定在拓扑绝缘体(TI)的表面状态,使用铁磁体/隧道势垒接触[1]。该方法已被用于测量其他TI系统中的电流产生的自旋[2-10],尽管测量的自旋电压的符号相互冲突[1,2,4,6 -10]。Tian等人希望使用他们在参考文献[4]中提出的模型来确定诱导自旋极化的符号,从而确定各个小组声称已经在体TI中采样了拓扑保护表面态的说法是否正确。我们的答复的中心点是,所提出的模型不能做到这一点,因为它没有包括单独的物理贡献,这些贡献独立地影响所测量的自旋极化的符号。

英文摘要:

We reported the first spin potentiometric measurement to electrically detect spin polarization arising from spin-momentum locking in topological insulator (TI) surface states using ferromagnet/tunnel barrier contacts [1]. This method has been adopted to measure the current generated spin in other TI systems [2-10], albeit with conflicting signs of the measured spin voltage [1,2,4,6-10]. Tian et al. wish to use their model as presented in Ref. [4] to determine the sign of the induced spin polarization, and thereby determine whether the claims of various groups to have sampled the topologically protected surface states in bulk TIs are correct. The central point of our Reply is that the model as presented is incapable of doing so because it fails to include separate physical contributions which independently effect the sign of the spin polarization measured.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑