arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1902.09418physics.opticsphysics.app-ph
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使用随机调制的X射线光学和射束表征:理论

X-ray optics and beam characterization using random modulation: Theory

Sebastien Berujon, Ruxandra Cojocaru, Pierre Piault, Rafael Celestre, Thomas Roth, Raymond Barrett, Eric Ziegler

摘要:

基于X射线的近场散斑相位感测方法提供了有效的手段来测量光学元件。在这里,我们提出了一个理论回顾这些散斑方法的光学特性的框架,并提供了一个概括的概念。正如我们在另一篇论文中通过实验证明的那样,这里理论上开发的方法可以应用于不同的光束和光学器件,以及需要波长计量的各种情况。通过了解各种处理方法之间的差异,可以找到并实施最适合每种计量方案的方法。

英文摘要:

X-ray near-field speckle-based phase-sensing approaches provide efficient means to characterise optical elements. Here, we present a theoretical review of several of these speckle methods in the frame of optical characterisation and provide a generalization of the concept. As we also demonstrate experimentally in another paper, the methods theoretically developed here can be applied with different beams and optics and within a variety of situations where at-wavelength metrology is desired. By understanding the differences between the various processing methods, it is possible to find and implement the best suited approach for each metrology scenario.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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