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arXiv 1812.06014cond-mat.mtrl-sci
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使用低能电子显微镜定量work function差异:混合封端钛酸锶的情况

Quantifying work function differences using low-energy electron microscopy: the case of mixed-terminated strontium titanate

Johannes Jobst, Laurens M. Boers, Chunhai Yin, Jan Aarts, Rudolf M. Tromp, Sense Jan van der Molen

摘要:

对于许多应用,重要的是以高横向分辨率测量表面的局部功函数。低能量电子显微镜经常用于这一目的,因为它在原则上非常适合,因为它结合了高分辨率成像和对局部静电势的高灵敏度。然而,对于具有不同功函数的区域的表面,与功函数不连续性相关联的横向静电场不可避免地使低能电子偏转,从而在这些不连续性附近引起伪影。我们使用光线跟踪模拟表明,这些文物延伸超过数百纳米,并导致高估的真实功函数差附近的不连续性的一个因素为1.6,如果使用标准的图像分析方法。我们证明了在混合终止钛酸锶表面,比较LEEM数据与详细的射线跟踪模拟导致更强大的估计的功函数的差异。

英文摘要:

For many applications, it is important to measure the local work function of a surface with high lateral resolution. Low-energy electron microscopy is regularly employed to this end since it is, in principle, very well suited as it combines high-resolution imaging with high sensitivity to local electrostatic potentials. For surfaces with areas of different work function, however, lateral electrostatic fields inevitably associated with work function discontinuities deflect the low-energy electrons and thereby cause artifacts near these discontinuities. We use ray-tracing simulations to show that these artifacts extend over hundreds of nanometers and cause an overestimation of the true work function difference near the discontinuity by a factor of 1.6 if the standard image analysis methods are used. We demonstrate on a mixed-terminated strontium titanate surface that comparing LEEM data with detailed ray-tracing simulations leads to much a more robust estimate of the work function difference.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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