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arXiv 1809.03296physics.plasm-ph
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红外光谱法测量等离子体壁电荷

Measuring the plasma-wall charge by infrared spectroscopy

K. Rasek, F. X. Bronold, M. Bauer, H. Fehske

摘要:

我们表明,由介电等离子体面向固体积累的电荷可以通过红外光谱测量。该方法利用了一堆材料支持在红外表面等离子体共振。对于频率附近的Berreman共振的层面临的等离子体的反射率下降-测量从背面的堆栈,不与等离子体接触-强烈依赖于入射角,使其成为一个理想的传感器的层的介电函数的变化,由于被困的过剩电荷的极化。作为入射红外线的角度和频率的函数的电荷诱导的倾斜的移位足够大,以通过衰减全反射设置来测量。

英文摘要:

We show that the charge accumulated by a dielectric plasma-facing solid can be measured by infrared spectroscopy. The approach utilizes a stack of materials supporting a surface plasmon resonance in the infrared. For frequencies near the Berreman resonance of the layer facing the plasma the reflectivity dip--measured from the back of the stack, not in contact with the plasma--depends strongly on the angle of incidence making it an ideal sensor for the changes of the layer's dielectric function due to the polarizability of the trapped surplus charges. The charge-induced shifts of the dip, both as a function of the angle and the frequency of the incident infrared light, are large enough to be measurable by attenuated total reflection setups.

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