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arXiv 1710.00544cond-mat.str-elcond-mat.mes-hallcond-mat.mtrl-sci
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厚外延MnSi薄膜磁序的倒易空间映射

Reciprocal space mapping of magnetic order in thick epitaxial MnSi films

B. Wiedemann, A. Chacon, S. L. Zhang, Y. Khaydukov, T. Hesjedal, O. Soltwedel, T. Keller, S. Mühlbauer, T. Adams, M. Halder, C. Pfleiderer, P. Böni

摘要:

本文报道了在厚膜极限条件下,用掠入射小角中子散射(GISANS)和互补离镜面中子反射(OSR)测量了Si(111)上外延MnSi单晶薄膜的磁序。GISANS和OSR提供了一种直接倒易空间映射的方法,揭示了在平行和垂直于薄膜的磁场下垂直于薄膜的磁调制,其中额外的极化中子反射计(PNR)和磁化测量与文献非常一致。无论磁场方向如何,我们的数据并不表明存在更复杂的自旋纹理,特别是形成skyrmions。这种观察建立了一个明显的差异,在垂直场下,其中skyrmion晶格占主导地位的相图与块状样品的类似厚度的MnSi。扩展的X射线吸收精细结构测量表明,小位移的Si位置内的未应变的晶胞控制的磁状态,代表薄膜和薄的散装样品之间的主要区别。

英文摘要:

We report grazing incidence small angle neutron scattering (GISANS) and complementary off-specular neutron reflectometry (OSR) of the magnetic order in a single-crystalline epitaxial MnSi film on Si(111) in the thick film limit. Providing a means of direct reciprocal space mapping, GISANS and OSR reveal a magnetic modulation perpendicular to the films under magnetic fields parallel and perpendicular to the film, where additional polarized neutron reflectometry (PNR) and magnetization measurements are in excellent agreement with the literature. Regardless of field orientation, our data does not suggest the presence of more complex spin textures, notably the formation of skyrmions. This observation establishes a distinct difference with bulk samples of MnSi of similar thickness under perpendicular field, in which a skyrmion lattice dominates the phase diagram. Extended x-ray absorption fine structure measurements suggest that small shifts of the Si positions within the unstrained unit cell control the magnetic state, representing the main difference between the films and thin bulk samples.

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