利用电子辐照将低维材料操纵到单原子水平
Manipulating low-dimensional materials down to the level of single atoms with electron irradiation
摘要：
扫描透射电子显微镜（STEM）仪器的最新进展使得能够以亚原子精度聚焦电子束并在单个原子水平上识别材料的化学结构。在这里，我们将讨论在电子辐照下低维材料结构中观察到的动力学，以及电子束在单原子操纵中的潜在用途。作为后一种能力的演示，我们展示了如何从60 keV的电子大小的STEM探针的动量转移可以用来移动嵌入在石墨烯晶格中的硅原子与原子精度。
英文摘要：
Recent advances in scanning transmission electron microscopy (STEM) instrumentation have made it possible to focus electron beams with sub-atomic precision and to identify the chemical structure of materials at the level of individual atoms. Here we discuss the dynamics that are observed in the structure of low-dimensional materials under electron irradiation, and the potential use of electron beams for single-atom manipulation. As a demonstration of the latter capability, we show how momentum transfer from the electrons of a 60-keV Ångström-sized STEM probe can be used to move silicon atoms embedded in the graphene lattice with atomic precision.
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