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arXiv 1610.03382cond-mat.mtrl-sci
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442 nm激发角分辨偏振拉曼光谱研究黑磷

Study of Black Phosphorus Using Angle-Resolved Polarized Raman Spectroscopy with 442 nm Excitation

Weijun Luo, Qian Song, Guangnan Zhou, David Tuschel, Guangrui Xia

摘要:

我们研究了10至200 nm厚的黑色磷片SiO2/Si和聚酰亚胺基板上的角分辨偏振拉曼光谱(ARPRS),使用442 nm的激发波长。结果表明,442 nm激发的ARPRS可以提供明确的,方便的,非破坏性和快速确定BP的晶体取向。研究了拉曼光谱和拉曼张量元的衬底和厚度依赖性。这些依赖关系被证明是受拉曼激发激光加热效应。通过与高温下的原位拉曼测量进行比较,我们能够量化激光加热效应,这对于聚酰亚胺衬底上的BP的拉曼测量是重要的且难以避免的,因为衬底的导热性差。通过衬底加热的热处理被示出对SiO2/Si衬底上的BP具有显著影响,但由于较小的热膨胀失配,对聚酰亚胺上的BP没有显著影响。我们的研究结果提供了重要的见解的拉曼光谱表征BP在不同的基板上。

英文摘要:

We investigated 10 to 200 nm thick black phosphorus flakes on SiO2/Si and polyimide substrates by Angle-resolved Polarized Raman spectra (ARPRS) using 442 nm excitation wavelength. The results revealed that ARPRS with 442 nm excitation can provide unambiguous, convenient, non-destructive and fast determination of BP's crystallographic orientation. The substrate and thickness dependencies of Raman spectra and Raman tensor elements were studied. These dependencies were shown to be influenced by Raman excitation laser heating effect. By comparing with in-situ Raman measurements at elevated temperatures, we were able to quantify the laser-heating effect, which is significant and hard to avoid for Raman measurements of BP on polyimide substrates due to the poor thermal conductivity of the substrate. Thermal processing by substrate heating was shown to have a significant impact on BP on SiO2/Si substrate, but not for BP on polyimide due to smaller thermal expansion mismatch. Our results give important insights on Raman Spectroscopy characterizations of BP on different substrates.

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