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arXiv 1605.03089cond-mat.mtrl-sci
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GaN在纳米结构覆盖硅上的氢化物气相外延

Hydride Vapor Phase Epitaxy of GaN on Silicon Covered by Nanostructures

U. Jahn, M. Musolino, J. Lähnemann, P. Dogan, S. Fernández Garrido, J. F. Wang, K. Xu, D. Cai, L. F. Bian, X. J. Gong, H. Yang

摘要:

采用两步氢化物气相外延(HVPE)工艺在硅衬底上沉积了几十个$μ$ m GAN。衬底已被覆盖的AlN层和GAN纳米结构生长的等离子体辅助分子束外延。在第一个低温(低T)HVPE步骤,堆垛层错(SF)的形式,显示出不同的发光线和条状特征的阴极射线发光图像的横截面的层。这些阴极射线发光的功能允许洞察到的生长过程。在第二高温(高T)步骤期间,SF消失,并且GAN层的这部分的发光由施主束缚激子主导。对于由薄AlN缓冲层和GAN纳米结构组成的模板,没有观察到通过HVPE生长的GAN中的硅掺入。此外,(高T)HVPE步骤的生长模式取决于AlN/GAN模板的具体结构,其中在第一种情况下,外延由缓慢生长的刻面的形成主导,而在第二种情况下,外延直接沿着c轴进行。

英文摘要:

Several ten $μ$m GaN have been deposited on a silicon substrate using a two-step hydride vapor phase epitaxy (HVPE) process. The substrates have been covered by AlN layers and GaN nanostructures grown by plasma-assisted molecular-beam epitaxy. During the first low-temperature (low-T) HVPE step, stacking faults (SF) form, which show distinct luminescence lines and stripe-like features in cathodoluminescence images of the cross-section of the layers. These cathodoluminescence features allow for an insight into the growth process. During a second high-temperature (high-T) step, the SFs disappear, and the luminescence of this part of the GaN layer is dominated by the donor-bound exciton. For templates consisting of both a thin AlN buffer and GaN nanostructures, a silicon incorporation into the GaN grown by HVPE is not observed. Moreover, the growth mode of the (high-T) HVPE step depends on the specific structure of the AlN/GaN template, where in a first case, the epitaxy is dominated by the formation of slowly growing facets, while in a second case, the epitaxy proceeds directly along the c-axis.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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