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arXiv 1506.04823cond-mat.mtrl-scicond-mat.other
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WTe $_2$晶体质量与极磁电阻的相关性

Correlation of Crystal Quality and Extreme Magnetoresistance of WTe$_2$

Mazhar N. Ali, Leslie Schoop, Jun Xiong, Steven Flynn, Quinn Gibson, Max Hirschberger, N. P. Ong, R. J. Cava

摘要:

高品质的WTe $_2$的单晶生长使用Te熔剂,然后通过涉及自气相传输的清洁步骤。该方法是可重复的,并且产生的单晶质量始终高于通常通过卤化物辅助的蒸气传输方法获得的单晶质量。在9特斯拉和2开尔文的磁阻(MR)值高达175万\%,几乎比以前报道的这种材料高一个数量级,获得晶体上的剩余电阻率比(RRR)约为1250。MR遵循近B $^2$定律(B = 1.95(1)),并且假设半经典模型,发现最高质量晶体的平均载流子迁移率在2 K下为~ 167,000 cm $^2$ /Vs。研究发现,在磁通生长过程中,RRR、MR比和平均载流子迁移率($μ_{avg}$)与冷却速率之间存在相关性。

英文摘要:

High quality single crystals of WTe$_2$ were grown using a Te flux followed by a cleaning step involving self-vapor transport. The method is reproducible and yields consistently higher quality single crystals than are typically obtained via halide assisted vapor transport methods. Magnetoresistance (MR)values at 9 Tesla and 2 Kelvin as high as 1.75 million \%, nearly an order of magnitude higher than previously reported for this material, were obtained on crystals with residual resistivity ratio (RRR) of approximately 1250. The MR follows a near B$^2$ law (B = 1.95(1)) and, assuming a semiclassical model, the average carrier mobility for the highest quality crystal was found to be ~167,000 cm$^2$/Vs at 2 K. A correlation of RRR, MR ratio and average carrier mobility ($μ_{avg}$) is found with the cooling rate during the flux growth.

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