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arXiv 1504.04734cond-mat.mtrl-sci
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(AlInGa)N量子阱结构中俄歇产生的高能载流子的输运和俘获特性

Transport and Capture Properties of Auger-Generated High-Energy Carriers in (AlInGa)N Quantum Well Structures

A. Nirschl, M. Binder, M. Schmid, M. M. Karow, I. Pietzonka, H. -J. Lugauer, R. Zeisel, M. Sabathil, D. Bougeard, B. Galler

摘要:

最近的光致发光实验M。Binder等人[Appl.Phys.Lett. 103,071108(2013)]展示了通过(AlInGa)N多量子阱中的俄歇复合产生的高能载流子的可视化。推导出两个基本的限制,这降低了俄歇过程的检测效率,有助于降低内部量子效率:这些热电子和空穴在检测阱中的捕获概率和俄歇复合类型的不对称性。我们研究了这些高能载流子的输运和俘获特性,包括极化场、到产生阱的俘获距离和俘获体积。所有这三个因素都显示出对这些热粒子的检测有明显的影响。此外,研究支持的发现,电子-电子-空穴超过电子-空穴-空穴俄歇复合,如果这两种类型的载流子的密度是相似的。总的来说,结果增加了俄歇过程在(AlInGa)N基LED的效率降低中起重要作用的证据。

英文摘要:

Recent photoluminescence experiments presented by M. Binder et al. [Appl. Phys. Lett. 103, 071108 (2013)] demonstrated the visualization of high-energy carriers generated by Auger recombination in (AlInGa)N multi quantum wells. Two fundamental limitations were deduced which reduce the detection efficiency of Auger processes contributing to the reduction in internal quantum efficiency: the capture probability of these hot electrons and holes in a detection well and the asymmetry in type of Auger recombination. We investigate the transport and capture properties of these high-energy carriers regarding polarization fields, the capture distance to the generating well and the capture volume. All three factors are shown to have a noticeable impact on the detection of these hot particles. Furthermore, the investigations support the finding that electron-electron-hole exceeds electron-hole-hole Auger recombination if the densities of both carrier types are similar. Overall, the results add to the evidence that Auger processes play an important role in the reduction of efficiency in (AlInGa)N based LEDs.

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