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arXiv 1503.07779cond-mat.str-el
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Soft X-ray Angle Resolved Photoemission with Micro Positioning Techniques for Metallic V$_2$O$_3$

H. Fujiwara, T. Kiss, Y. K. Wakabayashi, Y. Nishitani, T. Mori, Y. Nakata, S. Kitayama, K. Fukushima, S. Ikeda, H. Fuchimoto, Y. Minowa, S. -K. Mo, J. D. Denlin… 展开作者

H. Fujiwara, T. Kiss, Y. K. Wakabayashi, Y. Nishitani, T. Mori, Y. Nakata, S. Kitayama, K. Fukushima, S. Ikeda, H. Fuchimoto, Y. Minowa, S. -K. Mo, J. D. Denlinger, J. W. Allen, P. Metcalf, M. Imai, K. Yoshimura, S. Suga, T. Muro, A. Sekiyama

英文摘要:

We have performed soft-X-ray angle resolved photoemission for metallic V$_2$O$_3$. Combining a micro focus beam (40 x 65 $μ$m$^2$) and micro positioning techniques with a long working distance microscope, we have succeeded in observing band dispersions from tiny cleavage surfaces with typical size of the several tens of $μ$m. The photoemission spectra show a clear position dependence reflecting the morphology of the cleaved sample surface. By selecting high quality flat regions on the sample surface, we have succeeded in band mapping using both photon-energy and polar-angle dependences, opening the door to three-dimensional ARPES for typical three dimensional correlated materials where large cleavage planes are rarely obtained.

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