新型离面反射光栅和硅孔光学光谱仪在PANTER的性能测试
Performance Testing of a Novel Off-plane Reflection Grating and Silicon Pore Optic Spectrograph at PANTER
摘要：
在马克斯·普朗克地外物理研究所PANTER X射线测试设备上测试了由径向规则离面反射光栅和硅孔光学器件组成的X射线摄谱仪。所使用的硅孔光学（SPO）堆栈是Arcus小型探测器任务的测试模块，它也将具有对准的离面反射光栅。该测试是第一次将两个离面光栅主动地彼此对准并与SPO对准以产生重叠光谱。使用主动对准模块对准光栅，该主动对准模块允许使用可在测试室外部控制的picerotic致动器在三个自由度上独立操纵后续光栅到参考光栅。我们报告谱仪和主动对准光栅的线扩展函数，并计划未来的发展。
英文摘要：
An X-ray spectrograph consisting of radially ruled off-plane reflection gratings and silicon pore optics was tested at the Max Planck Institute for extraterrestrial Physics PANTER X-ray test facility. The silicon pore optic (SPO) stack used is a test module for the Arcus small explorer mission, which will also feature aligned off-plane reflection gratings. This test is the first time two off-plane gratings were actively aligned to each other and with a SPO to produce an overlapped spectrum. The gratings were aligned using an active alignment module which allows for the independent manipulation of subsequent gratings to a reference grating in three degrees of freedom using picomotor actuators which are controllable external to the test chamber. We report the line spread functions of the spectrograph and the actively aligned gratings, and plans for future development.
机构、总结、中文摘要均由AI分析而来，可能存在错误，请以论文正文为准。
