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arXiv 1503.00487cond-mat.mtrl-sci
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Carbon p Electron Ferromagnetism in Silicon Carbide

Y. Wang, Y. Liu, G. Wang, W. Anwand, C. Jenkins, E. Arenholz, F. Munnik, O. Gordan, G. Salvan, D. R. T. Zahn, X. Chen, S. Gemming, M. Helm, S. Zhou

英文摘要:

Ferromagnetism can occur in wide-band gap semiconductors as well as in carbon-based materials when specific defects are introduced. It is thus desirable to establish a direct relation between the defects and the resulting ferromagnetism. Here, we contribute to revealing the origin of defect-induced ferromagnetism using SiC as a prototypical example. We show that the long-range ferromagnetic coupling can be attributed to the p electrons of the nearest-neighbor carbon atoms around the VSiVC divacancies. Thus, the ferromagnetism is traced down to its microscopic, electronic origin.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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