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arXiv 1407.2140cond-mat.mtrl-sci
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基于具有电压产生应力的180度磁化切换的非易失性多铁性存储器中的位的高可靠性低能量写入

Highly reliable low-energy writing of bits in non-volatile multiferroic memory based on 180-degree magnetization switching with voltage-generated stress

Ayan K. Biswas, Supriyo Bandyopadhyay, Jayasimha Atulasimha

摘要:

与任何其他旋转方法相比,利用电生成的机械应变旋转磁致伸缩纳米磁体的磁化消耗了极少量的能量,并且将是在非易失性磁存储器中写入位的理想方法,除了应变通常不能将磁体的磁化旋转超过90度并将其“翻转”之外。我们描述了一种利用应变实现纳米磁体的磁化的完全180度旋转的方案,这将使得能够在利用磁隧道结实现的非易失性磁存储器中写入二进制位,磁隧道结的软层是两相磁致伸缩/压电多铁性材料。在室温下,这种写入方法的结果是:(1)能量耗散< 6200 kT/位,(2)写入错误概率< 10^-6,(3)写入时间约为1 ns,(4)低读取错误。这可能会导致一种新型的非易失性存储器,这种存储器非常可靠,快速,同时具有超能效。

英文摘要:

Rotating the magnetization of a magnetostrictive nanomagnet with electrically generated mechanical strain dissipates miniscule amount of energy compared to any other rotation method and would have been the ideal method to write bits in nonvolatile magnetic memory, except strain cannot ordinarily rotate the magnetization of magnet by more than 90 degrees and "flip" it. Here, we describe a scheme to achieve complete 180 degree rotation of the magnetization of a nanomagnet with strain that will enable writing of binary bits in non-volatile magnetic memory implemented with magneto-tunneling junctions whose soft layers are two-phase magnetostrictive/piezoelectric multiferroics. At room temperature, this writing method results in: (1) energy dissipation < 6200 kT per bit, (2) write error probability < 10^-6, (3) write time of ~ 1 ns, and (4) low read error. This could potentially lead to a new genre of non-volatile memory that is extremely reliable, fast and, at the same time, ultra-energy-efficient.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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