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arXiv 1402.4255cond-mat.mtrl-sci
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厚度和应变对纳米结构Bi2Se3热电输运的影响

Thickness and strain effects on the thermoelectric transport in nanostructured Bi2Se3

Y. Saeed, N. Singh, U. Schwingenschlog

摘要:

利用van der Waals密度泛函理论和半经典Boltzmann理论研究了Bi 2 Se 3的1 ~ 6个五重层结构的结构稳定性、电子结构和热输运性质.对于单个QL,带隙为0.41 eV,当QL的数量增加到6个时,带隙减小到0.23 eV。单个QL具有比块体材料(0.10)显著更高的热电优值(0.27),其可以通过引入2.5%压缩应变进一步增强到0.30。正的声子频率下的应变表明,结构的稳定性保持。

英文摘要:

The structural stability, electronic structure, and thermal transport properties of one to six quintuple layers (QLs) of Bi2Se3 are investigated by van der Waals density functional theory and semi-classical Boltzmann theory. The bandgap amounts to 0.41 eV for a single QL and reduces to 0.23 eV when the number of QLs increases to six. A single QL has a significantly higher thermoelectric figure of merit (0.27) than the bulk material (0.10), which can be further enhanced to 0.30 by introducing 2.5% compressive strain. Positive phonon frequencies under strain indicate that the structural stability is maintained.

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