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arXiv 1402.3873cs.SE
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基于简化度量集的软件缺陷预测实证研究

An Empirical Study on Software Defect Prediction with a Simplified Metric Set

Peng He, Bing Li, Xiao Liu, Jun Chen, Yutao Ma

摘要:

软件缺陷预测在估计软件中最容易出现缺陷的组件方面起着至关重要的作用,并且大量的研究都在追求提高项目内或跨项目的预测准确性。然而,当可用的历史数据不足时,在项目内和跨项目缺陷预测之间做出适当决定的规则仍然不清楚。本文的目的是验证在不同的软件缺陷预测场景中,基于简化度量集的预测器的可行性,并探讨在特定项目中选择训练数据、分类器和度量子集的实用指导原则。首先,基于六个典型的分类器,我们构造了三种类型的预测器,在三种情况下使用软件度量集的大小。然后,我们验证了可接受的性能的预测器的基础上Top-k度量的统计方法。最后,我们尝试通过去除冗余度量来最小化Top-k度量子集,并且我们使用单向ANOVA检验来测试这样的最小度量子集的稳定性。实验结果表明:(1)训练数据的选择应取决于预测精度的具体要求;(2)使用简化的度量集建立的预测器工作良好,在资源有限的情况下非常有用;(3)简单的分类器(例如,朴素贝叶斯)在使用简化的度量集进行缺陷预测时也倾向于表现良好;以及(4)在若干情况下,可以识别最小度量子集,以便于在实践中具有可接受的预测精度损失的一般缺陷预测过程。表12列出了在不同情景下选择合适的简化指标集的指南。

英文摘要:

Software defect prediction plays a crucial role in estimating the most defect-prone components of software, and a large number of studies have pursued improving prediction accuracy within a project or across projects. However, the rules for making an appropriate decision between within- and cross-project defect prediction when available historical data are insufficient remain unclear. The objective of this work is to validate the feasibility of the predictor built with a simplified metric set for software defect prediction in different scenarios, and to investigate practical guidelines for the choice of training data, classifier and metric subset of a given project. First, based on six typical classifiers, we constructed three types of predictors using the size of software metric set in three scenarios. Then, we validated the acceptable performance of the predictor based on Top-k metrics in terms of statistical methods. Finally, we attempted to minimize the Top-k metric subset by removing redundant metrics, and we tested the stability of such a minimum metric subset with one-way ANOVA tests. The experimental results indicate that (1) the choice of training data should depend on the specific requirement of prediction accuracy; (2) the predictor built with a simplified metric set works well and is very useful in case limited resources are supplied; (3) simple classifiers (e.g., Naive Bayes) also tend to perform well when using a simplified metric set for defect prediction; and (4) in several cases, the minimum metric subset can be identified to facilitate the procedure of general defect prediction with acceptable loss of prediction precision in practice. The guideline for choosing a suitable simplified metric set in different scenarios is presented in Table 12.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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