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arXiv 2102.12007cs.SE
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从业者对缺陷预测模型目标和视觉解释的理解

Practitioners' Perceptions of the Goals and Visual Explanations of Defect Prediction Models

Jirayus Jiarpakdee, Chakkrit Tantithamthavorn, John Grundy

摘要:

软件缺陷预测模型是从历史软件数据构建的分类器。这种软件缺陷预测模型已经被提出来帮助开发人员优化有限的软件质量保证(SQA)资源,并帮助管理人员制定SQA计划。以前的研究有不同的目标,他们的缺陷预测模型,并使用不同的技术来生成他们的模型的视觉解释。然而,目前还不清楚从业者对(1)这些缺陷预测模型目标和(2)用于可视化这些模型的模型无关技术的看法。我们进行了一项定性调查,以调查从业者的缺陷预测模型的目标和模型无关的技术,用于生成缺陷预测模型的视觉解释的看法。我们发现,(1)82%-84%的受访者认为缺陷预测模型的三个目标是有用的;(2)LIME是理解有助于预测文件的最重要特征的最首选技术,而ANOVA/VarImp是理解与过去软件缺陷相关的特征的第二首选技术。我们的研究结果突出了调查如何提高对缺陷预测模型及其预测的理解的重要性。因此,来自可解释AI领域的模型不可知技术可以帮助从业者理解缺陷预测模型及其预测。

英文摘要:

Software defect prediction models are classifiers that are constructed from historical software data. Such software defect prediction models have been proposed to help developers optimize the limited Software Quality Assurance (SQA) resources and help managers develop SQA plans. Prior studies have different goals for their defect prediction models and use different techniques for generating visual explanations of their models. Yet, it is unclear what are the practitioners' perceptions of (1) these defect prediction model goals, and (2) the model-agnostic techniques used to visualize these models. We conducted a qualitative survey to investigate practitioners' perceptions of the goals of defect prediction models and the model-agnostic techniques used to generate visual explanations of defect prediction models. We found that (1) 82%-84% of the respondents perceived that the three goals of defect prediction models are useful; (2) LIME is the most preferred technique for understanding the most important characteristics that contributed to a prediction of a file, while ANOVA/VarImp is the second most preferred technique for understanding the characteristics that are associated with software defects in the past. Our findings highlight the significance of investigating how to improve the understanding of defect prediction models and their predictions. Hence, model-agnostic techniques from explainable AI domain may help practitioners to understand defect prediction models and their predictions.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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