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arXiv 1305.0465cond-mat.mes-hall
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石墨烯畴表面电位测量的标准化

Standardization of surface potential measurements of graphene domains

Vishal Panchal, Ruth Pearce, Rositza Yakimova, Alexander Tzalenchuk, Olga Kazakova

摘要:

我们比较了三种最常用的扫描探针技术,以获得不同厚度的石墨烯域中的功函数的可靠值。石墨烯的表面电势(SP)通过电功能显微镜和光谱学技术的组合在霍尔棒几何结构中直接测量,这使得石墨烯域的校准功函数测量对于单层和双层分别具有约4.55+/-0.02eV和约4.44+/-0.02eV的值。我们表明,调频开尔文探针力显微镜(FM-KPFM)提供了更准确的测量SP比调幅(AM)-KPFM。不同的技术得到的实验结果之间的差异进行了讨论。此外,我们使用FM-KPFM对器件电阻的特定组件进行非接触式测量。我们展示了电极-石墨烯接触电阻的强非欧姆行为,并提取了石墨烯沟道电阻率。

英文摘要:

We compare the three most commonly used scanning probe techniques to obtain a reliable value of the work function in graphene domains of different thickness. The surface potential (SP) of graphene is directly measured in Hall bar geometry via a combination of electrical functional microscopy and spectroscopy techniques, which enables calibrated work function measurements of graphene domains with values ~4.55+/-0.02 eV and ~4.44+/-0.02eV for single- and bi-layer, respectively. We demonstrate that frequency-modulated Kelvin probe force microscopy (FM-KPFM) provides more accurate measurement of the SP than amplitude-modulated (AM)-KPFM. The discrepancy between experimental results obtained by different techniques is discussed. In addition, we use FM-KPFM for contactless measurements of the specific components of the device resistance. We show a strong non-Ohmic behavior of the electrode-graphene contact resistance and extract the graphene channel resistivity.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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