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arXiv 1207.2830cond-mat.mtrl-sci
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晶粒尺寸对退火SnS薄膜带隙的影响

Influence of Grain Size on the Band-gap of Annealed SnS Thin Films

Priyal Jain, P. Arun

摘要:

本文报道了真空退火后SnS薄膜的光学带隙的变化。利用X射线衍射、紫外-可见光谱和拉曼光谱对样品进行了表征。结果表明,退火对纳米晶样品的晶格结构和晶胞尺寸没有影响,但对晶粒尺寸有控制作用。带隙(Eg)随晶粒尺寸的增大而减小。对于所研究的样品,发现Eg值非常高(1.8-2.5 eV)。

英文摘要:

The manuscript reports the variation in optical band-gap of vacuum annealed SnS thin films. The samples were characterized by using X-Ray Diffraction, UV-visible Spectroscopy and Raman Analysis. Results show that while annealing does not effect the nano-crystalline sample's lattice structure or unit cell size it does control the grain size. The band-gap (Eg) decreases with increase in grain size. Eg values were found to be very high (1.8-2.5 eV) for samples studied.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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