arXivDaily arXiv每日学术速递 周一至周五更新
arXiv 1302.3953cond-mat.mtrl-sci
收藏

关于硫化锡纳米晶薄膜的Refractive Index

Comments on the Refractive Index of Tin Sulphide Nano-crystalline Thin Films

Amit Jakhar, Ashu Jamdagni, Ayushi Bakshi, Taruna Verma, Vibhav Shukla, Priyal Jain, Nidhi Sinha, P Arun

摘要:

研究了纳米晶硫化锡(SnS)薄膜的折射率。实验数据与折射率的单振子模型符合得很好。在此基础上,我们解释了折射率的增加趋势,晶体有序性的改善,随着晶粒尺寸的增加。

英文摘要:

The refractive indices of nano-crystalline thin films of Tin (IV) Sulphide (SnS) were investigated here. The experimental data conformed well with the single oscillator model for refractive indices. Based on the this, we explain the increasing trend of refractive index to the improvement in crystal ordering with increasing grain size.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

↑