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arXiv 1206.2644astro-ph.COhep-exhep-ph
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XENON10对sub-GeV暗物质的首次直接探测极限

First Direct Detection Limits on sub-GeV Dark Matter from XENON10

Rouven Essig, Aaron Manalaysay, Jeremy Mardon, Peter Sorensen, Tomer Volansky

摘要:

第一个直接探测极限暗物质在兆电子伏至GeV的质量范围内,使用氙10数据。这种轻暗物质可以与电子一起散射,导致探测器目标材料中的原子电离,并导致单电子或少电子事件。我们使用2006年获得的15千克-天的数据来设定暗物质-电子散射截面的极限。在100 MeV时得到最强的边界,在90%CL时,σ_e < 3 x 10^{-38} cm ^2,而在20 MeV和1 GeV之间的暗物质质量在90%CL时的边界为σ_e < 10^{-37} cm ^2。这项分析提供了第一个原理证明,即直接探测实验可以对质量远低于GeV尺度的暗物质候选者敏感。

英文摘要:

The first direct detection limits on dark matter in the MeV to GeV mass range are presented, using XENON10 data. Such light dark matter can scatter with electrons, causing ionization of atoms in a detector target material and leading to single- or few-electron events. We use 15 kg-days of data acquired in 2006 to set limits on the dark-matter-electron scattering cross section. The strongest bound is obtained at 100 MeV where sigma_e < 3 x 10^{-38} cm^2 at 90% CL, while dark matter masses between 20 MeV and 1 GeV are bounded by sigma_e < 10^{-37} cm^2 at 90% CL. This analysis provides a first proof-of-principle that direct detection experiments can be sensitive to dark matter candidates with masses well below the GeV scale.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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