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arXiv 1206.0695cond-mat.mes-hall
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三元Bi2Te2Se类拓扑绝缘体的拓扑表面态和Dirac点调谐

Topological Surface States and Dirac point tuning in ternary Bi2Te2Se class of topological insulators

M. Neupane, S. -Y. Xu, L. A. Wray, A. Petersen, R. Shankar, N. Alidoust, Chang Liu, A. Fedorov, H. Ji, J. M. Allred, Y. S. Hor, T. -R. Chang, H. -T. Jeng, H. Li… 展开作者

M. Neupane, S. -Y. Xu, L. A. Wray, A. Petersen, R. Shankar, N. Alidoust, Chang Liu, A. Fedorov, H. Ji, J. M. Allred, Y. S. Hor, T. -R. Chang, H. -T. Jeng, H. Lin, A. Bansil, R. J. Cava, M. Z. Hasan

摘要:

使用角分辨光电子能谱,我们报告的电子结构的三元拓扑绝缘体的代表性成员。我们发现,这个家庭的几个成员,如Bi 2Se 2 Te,Bi 2 Te 2Se,和GeBi 2 Te 4,表现出单简并的Dirac-like表面状态,而Bi 2Se 2S是一个完全带隙的绝缘体,没有可测量的表面状态。其中一种化合物Bi 2Se 2 Te在与Sb电子合金化后显示出可调的表面态分散(SbxBi 2-xSe 2 Te系列)。三元族的其他成员,如GeBi 2 Te 4和BiTe1.5S1.5,在带隙表面有一个狄拉克点,前者被预测为非零的弱拓扑不变量,如(1;111),因此属于与BiTe1.5S1.5不同的拓扑类。这里介绍的测量能带结构将是一个有价值的指导解释运输,热电,热电测量这些化合物。在这些化合物中观察到的独特的表面能带拓扑结构有助于识别具有热电和自旋电子器件制造所需的所需柔性的设计材料。

英文摘要:

Using angle-resolved photoemission spectroscopy, we report electronic structure for representative members of ternary topological insulators. We show that several members of this family, such as Bi2Se2Te, Bi2Te2Se, and GeBi2Te4, exhibit a singly degenerate Dirac-like surface state, while Bi2Se2S is a fully gapped insulator with no measurable surface state. One of these compounds, Bi2Se2Te, shows tunable surface state dispersion upon its electronic alloying with Sb (SbxBi2-xSe2Te series). Other members of the ternary family such as GeBi2Te4 and BiTe1.5S1.5 show an in-gap surface Dirac point, the former of which has been predicted to show nonzero weak topological invariants such as (1;111); thus belonging to a different topological class than BiTe1.5S1.5. The measured band structure presented here will be a valuable guide for interpreting transport, thermoelectric, and thermopower measurements on these compounds. The unique surface band topology observed in these compounds contributes towards identifying designer materials with desired flexibility needed for thermoelectric and spintronic device fabrication.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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