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arXiv 1203.6293cond-mat.mes-hallcond-mat.mtrl-sci
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STM对GaAs中单个Fe杂质价态的调控

Valence state manipulation of single Fe impurities in GaAs by STM

J. Bocquel, V. R. Kortan, R. P. Campion, B. L. Gallagher, M. E. Flatté, P. M. Koenraad

摘要:

用截面扫描隧道显微镜(X-STM)研究了Fe在GaAs中的掺入。单个Fe原子的局域电子对比度与其电荷态密切相关。我们证明,施加的尖端电压可以用来操纵GaAs中单个Fe杂质的价态和自旋态。特别地,我们可以诱导从Fe(3+)-3d 5-等电子态到Fe(2+)-3d 6-电离受体态的跃迁,伴随着自旋矩的相关变化。Fe原子有时会在地形图中产生暗的各向异性特征,这与不同隧穿路径之间的干涉一致。

英文摘要:

The incorporation of Fe in GaAs was studied by cross-sectional scanning tunneling microscopy (X-STM). The observed local electronic contrast of a single Fe atom is found to depend strongly on its charge state. We demonstrate that an applied tip voltage can be used to manipulate the valence and spin state of single Fe impurities in GaAs. In particular we can induce a transition from the Fe{3+)- 3d5 - isoelectronic state to the Fe{2+} - 3d6 - ionized acceptor state with an associated change of the spin moment. Fe atoms sometimes produce dark anisotropic features in topographic maps, which is consistent with an interference between different tunneling paths.

机构、总结、中文摘要均由AI分析而来,可能存在错误,请以论文正文为准。

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